MCPSim: A Geant4-based generic simulation toolkit for electron multipliers represented by Microchannel Plate

MCPSim: A Geant4-based generic simulation toolkit for electron multipliers represented by Microchannel Plate

Citation

The article you provided is authored by Han Miaoa, Huaxing Peng, Baojun Yan, Shulin Liu, and Hai-Bo Li. Here's a citation you can use, but you may need to modify it based on the citation style required:
**Miaoa, H., Peng, H., Yan, B., Liu, S., & Li, H. (Year). MCPSim: A Geant4-based generic simulation toolkit for electron multipliers represented by Microchannel Plate. Journal Name, Volume (Issue), Page range. **

Keywords

  • Simulation
  • Electron multiplier
  • MCP
  • Geant4
  • Secondary electron emission

Brief

A new type of Booster-Microchannel Plate (BMCP) detector is presented for signal amplification in Matrix-Assisted Laser Desorption/Ionization-Time of Flight (MALDI-TOF) mass spectrometry for ions with a mass-to-charge ratio exceeding 50,000. 

Summary

MCPSim is an open-source simulation toolkit designed specifically for electron multipliers, particularly Microchannel Plates (MCPs). It's built upon Geant4, ROOT, Boost, and other external packages. The toolkit offers a range of user interfaces for easy configuration of simulations.

Key features of MCPSim include:

  • Geometry Definition:
  1. Define geometry directly through code for maximum flexibility.
  2. Utilize predefined parameters specifically for MCP simulations.
  3. Import complex geometries from CAD files using the CADMesh toolkit.
  • Field Simulation:
  1. Apply a uniform electric field, which is a close approximation for many MCPs.
  2. Employ Finite Element Method (FEM) for precise field calculations in MCPs, especially at material interfaces.
  3. Utilize user-defined field maps for devices other than MCPs, allowing for flexibility in simulating diverse electron multiplier designs.
  • Particle Generation:
  1. Define simple monochromatic sources.
  2. Configure complex sources with customizable shapes, angular distributions, and energy spectra.
  • Secondary Electron Emission (SEE) Modeling:
  1. Employs the Furman model, which relies heavily on experimental measurements.
  2. Allows users to adjust parameters of the SEE model to match specific materials and experimental setups.

MCPSim provides output in ROOT or plain text format, giving details about particle tracks, interactions, and detector hits. The toolkit has been validated against experimental measurements and shows good agreement. Future development will focus on incorporating more realistic simulations of effects like saturation and space charge.

Origin: https://www.semanticscholar.org/reader/83ff6adf47fc122e51b89c7262608c347cfe7123

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