Monte Carlo simulations of microchannel plate detectors. I. Steady-state voltage bias results

Monte Carlo simulations of microchannel plate detectors. I. Steady-state voltage bias results

Citation

Wu, M., Kruschwitz, C. A., Morgan, D. V., & Morgan, J. (2007). Monte Carlo simulations of microchannel plate detectors I: steady-state voltage bias results. Review of Scientific Instruments, 78(10), 103504_. 

Keywords

  • Microchannel plate detectors
  • Monte Carlo simulations
  • Electron cascade
  • Secondary emission yield
  • Spatial resolution
  • Gain
  • Transit time
  • Bias voltage
  • X-ray detectors
  • Lead glass
  • Electron transport

Brief

The authors developed a new Monte Carlo simulation model of microchannel plate detectors and compared their model to experimental results. 

Summary

The authors created a Monte Carlo computer code to simulate the electron cascade in a microchannel plate (MCP) under a static applied voltage. The simulation includes elastic reflection of low-energy electrons from the channel wall, which is important at lower voltages. When model results were compared to measured MCP sensitivities, good agreement was found. Spatial resolution simulations of MCP-based detectors were also presented and found to agree with experimental measurements. The authors plan to extend the MCP simulations to include subnanosecond pulsed voltages and study MCP saturation due to space charge, positive wall charge buildup, and strip current limitations.

Origin: https://digital.library.unt.edu/ark:/67531/metadc893923/m2/1/high_res_d/935745.pdf

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