Simulation on Secondary Electron Multiplication Behavior of the Microchannel Plate under DC Mode

Simulation on Secondary Electron Multiplication Behavior of the Microchannel Plate under DC Mode

Citation

Li, F.; Jiang, D.; Jiao, P.; Sun, Y.; Huang, Y. Simulation on Secondary Electron Multiplication Behavior of the Microchannel Plate under DC Mode. Photonics 2022, 9, 978. https://doi.org/10.3390/photonics9120978 

Keywords

  • microchannel plate (MCP)
  • secondary electron
  • DC mode
  • electron multiplication
  • theoretical simulation
  • electron gain
  • bias angle
  • length-to-diameter ratio
  • output-electrode penetration depth

Brief

This article presents a simulation of electron multiplication in a microchannel plate operating under DC mode and investigates the influence of structural parameters on electron gain. 

Summary

This article discusses a study where researchers used computer simulations to understand how a microchannel plate (MCP) multiplies electrons under direct current (DC) conditions. An MCP is a component of imaging devices that amplifies electron flow to enhance image clarity.

The authors built a 3D model of a single MCP channel to simulate the electron multiplication process. The simulations, based on the Finite Integral Technique (FIT) and Monte Carlo methods, considered how factors like electrode depth, bias angle, channel length, and voltage affected electron gain (the ratio of output to input current density).

The simulations showed that:

  • Electron gain increased with a higher bias angle and voltage, while decreasing with a greater output-electrode penetration depth.
  • Longer channels increased gain at a normalized voltage (voltage adjusted for channel length), but there was an optimal length for maximizing gain at a constant voltage.
  • The energy of electrons exiting the MCP was concentrated within a specific range, which is beneficial for image resolution.

The study's findings provide insights that could help optimize MCP design for better performance in applications like low-light imaging and particle detection. 

Origin: https://www.semanticscholar.org/paper/Simulation-on-Secondary-Electron-Multiplication-of-Li-Jiang/e32e566c4c31b9b99e57dca6b1161d18d008a165
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