Avalanche Transistor Pulser for Fast-Gated Operation of Microchannel Plate Image-Intensifiers

Avalanche Transistor Pulser for Fast-Gated Operation of Microchannel Plate Image-Intensifiers

Citation

Lundy, A., Parker, J. R., Lunsford, J. S., & Martin, A. D. (1977). Avalanche Transistor Pulser for Fast-Gated Operation of Microchannel Plate Image-Intensifiers. IEEE Transactions on Nuclear Science, NS-24, 2.

Keywords

  • Avalanche Transistor
  • Fast-Gated Operation
  • Microchannel Plate Image Intensifier (MCPI)
  • High-Speed Photography
  • Pulse Characteristics
  • Circuit Design
  • Performance and Limitations
  • Divider Network

Brief

This article details the design and performance of an avalanche transistor pulser used for fast-gated operation of a microchannel plate image intensifier. 

Summary

The article details the design and performance of an avalanche transistor pulser used to operate a microchannel plate image-intensifier (MCPI) tube for high-speed photography.

  • The MCPI tube is shuttered by applying a +270 volt pulse to its input gap, which is normally back-biased with -90 volts.
  • Due to the high cost of the tubes, a line-type pulser with limited stored energy is used to prevent tube damage from pulser malfunction.
  • The pulser utilizes 2N3700 avalanche transistors in series to generate 1000 volt pulses with rise and fall times of less than 5 ns.
  • The transistors are mounted on hybrid substrates to reduce circuit inductance and improve rise time.
  • A mixer-attenuator circuit reduces the pulse amplitude to 270 volts before it is applied to the MCPI tube.
  • A divider network provides DC operating voltages and control of transient voltages on the MCPI tube, including programmable gain control in "f-stop" steps.
  • The system achieves an effective exposure time of 15 ns with a resolution of 17 to 19 line pairs/mm.
  • The authors also discuss various challenges encountered during the development process:
  • Limited availability of transistors suitable for avalanche mode operation and lack of reliable data on their performance characteristics.
  • Triggering stability issues with different biasing schemes and transistor configurations.
  • Impedance mismatch between the pulser and the capacitive load of the MCPI tube, requiring careful cable selection and minimization of inductance.
  • Transient voltage spikes across the MCPI tube during turn-on and turn-off, necessitating the use of zener diodes for protection.
  • Reliability concerns regarding capacitors in the divider network, addressed by using high-reliability components with special testing.
  • Limited lifetime of the 2N3700 transistors when generating longer pulses at high currents.
Origin: https://digital.library.unt.edu/ark:/67531/metadc1056330/m2/1/high_res_d/5188712.pdf
Back to blog