Optimization of vertically aligned carbon nanotube beam trajectory with the help of focusing electrode in the microchannel plate
Citation
B. C. Adhikari, B. Ketan, R. Patil, E. H. Choi, and K. C. Park, "Optimization of vertically aligned carbon nanotube beam trajectory with the help of focusing electrode in the microchannel plate," Sci. Rep., vol. 13, no. 1, p. 15140, Sep. 2023.
Keywords
- Carbon nanotubes (CNTs)
- Field emission
- Electron beam
- Focusing electrode
- Microchannel plate (MCP)
- High-dense bright spot
- Applications
- Simulation
Brief
This article presents the fabrication of a carbon nanotube-based cold cathode electron beam that is optimized to produce a high-dense bright spot, useful for applications such as multi-electron beam microscopy and nano-focused X-ray technology.
Summary
This article presents a study about the optimization of vertically aligned carbon nanotube (CNT) beam trajectory for enhanced field emission properties using a focusing electrode within a microchannel plate (MCP).
Here are the key findings:
- The study found that by using a focusing electrode, the electron beam trajectory could be reduced, leading to higher brightness and current density in the MCP without any loss in current.
- The optimal configuration involved a focusing electrode with a hole size of 2 mm placed 1 mm from the gate mesh electrode and a low bias voltage of -200V. This resulted in a high-dense bright spot with a full width at half maximum (FWHM) of 0.9 mm and an opening angle of 0.9°.
- This setup was cheaper and easier to fabricate compared to previous configurations.
- The study compares its results with existing research, showing that the achieved electron beam spot size is smaller and brighter.
- The authors suggest potential applications for this optimized CNT electron beam source in high-resolution multi-electron beam microscopy and nano-focused X-ray systems.