Effect of different scintillator choices on the X-ray imaging performance of CMOS sensors


Alikunju, R. P., Kearney, S., Moss, R., Khan, A., Stamatis, I., Bullard, E., Anaxagoras, T., Brodrick, J., & Olivo, A. (2023). Effect of different scintillator choices on the X-ray imaging performance of CMOS sensors. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1050, 168136. 


  • CMOS, X-ray Detectors
  • Fiber Optic Plate (FOP)
  • Scintillator, Pixel Pitch
  • Scintillator Thickness
  • X-ray Imaging Performance
  • Detective Quantum Efficiency (DQE)
  • Modulation Transfer Function (MTF)
  • Noise Power Spectrum (NPS)


This article compares the X-ray performance of CMOS X-ray detectors in various configurations by varying parameters such as fiber optic face plate use, scintillator substrate coating, sensor pixel pitch, and scintillator thickness.


This article, published in 2023 in the journal Nuclear Instruments and Methods in Physics Research, A, was written by Rimcy Palakkappilly Alikunju, Stephen Kearney, Robert Moss, Asmar Khan, Iannis Stamatis, Edward Bullard, Thalis Anaxagoras, James Brodrick, and Alessandro Olivo. The authors compared the X-ray imaging performance of different CMOS X-ray detector configurations. The study found that detectors with a fiber optic plate (FOP) show better detective quantum efficiency (DQE) performance than those without an FOP. Additionally, detectors with white-coated aluminum substrate scintillators demonstrate a higher DQE than those with black-coated aluminum substrate scintillators. Detectors with 100 μm pixel pitch have a higher DQE than detectors with 50 μm pixel pitch. Lastly, when comparing scintillators of varying thicknesses, the thickest scintillator (800 μm) had the highest DQE.

Origin: https://discovery.ucl.ac.uk/id/eprint/10164808/1/1-s2.0-S0168900223001262-main.pdf

Back to blog