Indirectly illuminated X-ray area detector for X-ray photon correlation spectroscopy

Citation

Shinohara, Y., Imai, R., Kishimoto, H., Yagid, N., & Amemiya, Y. (2010). Indirectly illuminated X-ray area detector for X-ray photon correlation spectroscopy. Journal of Synchrotron Radiation, 17(5), 651–657.

Keywords

•  indirectly illuminated X-ray detectors
• X-ray photon correlation spectroscopy

Brief

 An indirectly illuminated X-ray area detector can be used for X-ray photon correlation spectroscopy (XPCS) measurements of a variety of samples in both integrating and photon-counting modes.

Summary
This article, found in the Journal of Synchrotron Radiation, was published in 2010. The authors are Yuya Shinohara, Ryo Imai, Hiroyuki Kishimoto, Naoto Yagid, and Yoshiyuki Amemiya. This article focuses on the use of an indirectly illuminated X-ray area detector for X-ray photon correlation spectroscopy (XPCS).
This type of detector has the flexibility to perform measurements in two different modes: integrating and photon-counting.

• Integrating Mode: This mode is suitable when a high-intensity X-ray beam is used and there are minimal concerns regarding radiation damage affecting the XPCS data.
• Photon-counting Mode: This mode is essential when the scattering intensity is low, making it challenging to observe speckle patterns in a single shot using appropriate exposure times.

The detector's ability to switch between these modes makes it suitable for various X-ray scattering experiments. This includes high-resolution diffraction experiments requiring high sensitivity.

Origin: https://journals.iucr.org/s/issues/2010/06/00/wa5015/wa5015.pdf